BibTeX record conf/essderc/LavievilleKTBDG16

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@inproceedings{DBLP:conf/essderc/LavievilleKTBDG16,
  author       = {R. Lavieville and
                  Theano A. Karatsori and
                  Christoforos G. Theodorou and
                  Sylvain Barraud and
                  C. A. Dimitriadis and
                  G{\'{e}}rard Ghibaudo},
  title        = {Statistical characterization of drain current local and global variability
                  in sub 15nm Si/SiGe Trigate pMOSFETs},
  booktitle    = {46th European Solid-State Device Research Conference, {ESSDERC} 2016,
                  Lausanne, Switzerland, September 12-15, 2016},
  pages        = {142--145},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ESSDERC.2016.7599607},
  doi          = {10.1109/ESSDERC.2016.7599607},
  timestamp    = {Mon, 03 Jan 2022 22:21:42 +0100},
  biburl       = {https://dblp.org/rec/conf/essderc/LavievilleKTBDG16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}