BibTeX record conf/essderc/HoshiiFKWSSTIFS18

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@inproceedings{DBLP:conf/essderc/HoshiiFKWSSTIFS18,
  author       = {Takuya Hoshii and
                  Kazuyoshi Furukawa and
                  Kuniyuki Kakushima and
                  Masahiro Watanabe and
                  Naoyuki Shigvo and
                  Takuya Saraya and
                  Toshihiko Takakura and
                  Kazuo Itou and
                  Munetoshi Fukui and
                  Shinichi Suzuki and
                  Kiyoshi Takeuchi and
                  Iriya Muneta and
                  Hitoshi Wakabayashi and
                  Shinichi Nishizawa and
                  Kazuo Tsutsui and
                  Toshiro Hiramoto and
                  Hiromichi Ohashi and
                  Hiroshi Lwai},
  title        = {Verification of the Injection Enhancement Effect in IGBTs by Measuring
                  the Electron and Hole Currents Separately},
  booktitle    = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
                  Dresden, Germany, September 3-6, 2018},
  pages        = {26--29},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ESSDERC.2018.8486870},
  doi          = {10.1109/ESSDERC.2018.8486870},
  timestamp    = {Tue, 20 Apr 2021 15:05:20 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/HoshiiFKWSSTIFS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}