BibTeX record conf/essderc/BeekRODCLK18

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@inproceedings{DBLP:conf/essderc/BeekRODCLK18,
  author       = {Simon Van Beek and
                  Philippe Roussel and
                  Barry J. O'Sullivan and
                  Robin Degraeve and
                  Stefan Cosemans and
                  Dimitri Linten and
                  Gouri Sankar Kar},
  title        = {Study of breakdown in {STT-MRAM} using ramped voltage stress and all-in-one
                  maximum likelihood fit},
  booktitle    = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
                  Dresden, Germany, September 3-6, 2018},
  pages        = {146--149},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ESSDERC.2018.8486879},
  doi          = {10.1109/ESSDERC.2018.8486879},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/BeekRODCLK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}