BibTeX record conf/essderc/BazuIVGSRUW13

download as .bib file

@inproceedings{DBLP:conf/essderc/BazuIVGSRUW13,
  author       = {Marius Bazu and
                  Virgil Emil Ilian and
                  Dragos Varsescu and
                  Lucian Galateanu and
                  Vili Sikio and
                  Meelis Reimets and
                  Volker Uhl and
                  Manuel Weiss},
  title        = {Reliability tests for discriminating between technological variants
                  of {QFN} packaging},
  booktitle    = {Proceedings of the European Solid-State Device Research Conference,
                  {ESSDERC} 2013, Bucharest, Romania, September 16-20, 2013},
  pages        = {226--229},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ESSDERC.2013.6818860},
  doi          = {10.1109/ESSDERC.2013.6818860},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/BazuIVGSRUW13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.