BibTeX record conf/dtis/NekooeiN15

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@inproceedings{DBLP:conf/dtis/NekooeiN15,
  author       = {Amirreza Nekooei and
                  Zainalabedin Navabi},
  title        = {Multi-valued logic test access mechanism for test time and power reduction},
  booktitle    = {10th International Conference on Design {\&} Technology of Integrated
                  Systems in Nanoscale Era, {DTIS} 2015, Napoli, Italy, April 21-23,
                  2015},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/DTIS.2015.7127351},
  doi          = {10.1109/DTIS.2015.7127351},
  timestamp    = {Wed, 16 Oct 2019 14:14:56 +0200},
  biburl       = {https://dblp.org/rec/conf/dtis/NekooeiN15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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