BibTeX record conf/dsd/RauterHIK16

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@inproceedings{DBLP:conf/dsd/RauterHIK16,
  author       = {Tobias Rauter and
                  Andrea H{\"{o}}ller and
                  Johannes Iber and
                  Christian Kreiner},
  editor       = {Paris Kitsos},
  title        = {Using Model-Based Testing for Manufacturing and Integration-Testing
                  of Embedded Control Systems},
  booktitle    = {2016 Euromicro Conference on Digital System Design, {DSD} 2016, Limassol,
                  Cyprus, August 31 - September 2, 2016},
  pages        = {463--470},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/DSD.2016.13},
  doi          = {10.1109/DSD.2016.13},
  timestamp    = {Thu, 23 Mar 2023 23:59:36 +0100},
  biburl       = {https://dblp.org/rec/conf/dsd/RauterHIK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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