BibTeX record conf/dsaa/Hirsch0M19

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@inproceedings{DBLP:conf/dsaa/Hirsch0M19,
  author       = {Vitali Hirsch and
                  Peter Reimann and
                  Bernhard Mitschang},
  editor       = {Lisa Singh and
                  Richard D. De Veaux and
                  George Karypis and
                  Francesco Bonchi and
                  Jennifer Hill},
  title        = {Data-Driven Fault Diagnosis in End-of-Line Testing of Complex Products},
  booktitle    = {2019 {IEEE} International Conference on Data Science and Advanced
                  Analytics, {DSAA} 2019, Washington, DC, USA, October 5-8, 2019},
  pages        = {492--503},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/DSAA.2019.00064},
  doi          = {10.1109/DSAA.2019.00064},
  timestamp    = {Thu, 06 Feb 2020 16:02:58 +0100},
  biburl       = {https://dblp.org/rec/conf/dsaa/Hirsch0M19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}