BibTeX record conf/dft/XuH16

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@inproceedings{DBLP:conf/dft/XuH16,
  author       = {Xiaolin Xu and
                  Daniel E. Holcomb},
  title        = {Reliable {PUF} design using failure patterns from time-controlled
                  power gating},
  booktitle    = {2016 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2016, Storrs, CT, USA,
                  September 19-20, 2016},
  pages        = {135--140},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/DFT.2016.7684085},
  doi          = {10.1109/DFT.2016.7684085},
  timestamp    = {Fri, 24 Mar 2023 00:02:10 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/XuH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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