BibTeX record conf/dft/TaouilHMB13

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@inproceedings{DBLP:conf/dft/TaouilHMB13,
  author       = {Mottaqiallah Taouil and
                  Said Hamdioui and
                  Erik Jan Marinissen and
                  Sudipta Bhawmik},
  title        = {Impact of mid-bond testing in 3D stacked ICs},
  booktitle    = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
                  NY, USA, October 2-4, 2013},
  pages        = {178--183},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/DFT.2013.6653603},
  doi          = {10.1109/DFT.2013.6653603},
  timestamp    = {Mon, 05 Feb 2024 20:32:50 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/TaouilHMB13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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