BibTeX record conf/dft/SiddiquaSRDFLBG17

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@inproceedings{DBLP:conf/dft/SiddiquaSRDFLBG17,
  author       = {Taniya Siddiqua and
                  Vilas Sridharan and
                  Steven E. Raasch and
                  Nathan DeBardeleben and
                  Kurt B. Ferreira and
                  Scott Levy and
                  Elisabeth Baseman and
                  Qiang Guan},
  title        = {Lifetime memory reliability data from the field},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244428},
  doi          = {10.1109/DFT.2017.8244428},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/SiddiquaSRDFLBG17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}