BibTeX record conf/dft/SailletPN05

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@inproceedings{DBLP:conf/dft/SailletPN05,
  author       = {B. Saillet and
                  Jean{-}Michel Portal and
                  Didier N{\'{e}}e},
  title        = {Flash Memory Cell: Parametric Test Data Reconstruction for Process
                  Monitoring},
  booktitle    = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
  pages        = {131--139},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/DFTVS.2005.36},
  doi          = {10.1109/DFTVS.2005.36},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/SailletPN05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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