BibTeX record conf/dft/KlineLMJ19

download as .bib file

@inproceedings{DBLP:conf/dft/KlineLMJ19,
  author       = {Donald Kline Jr. and
                  Stephen Longofono and
                  Rami G. Melhem and
                  Alex K. Jones},
  title        = {Predicting Single Event Effects in {DRAM}},
  booktitle    = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
                  October 2-4, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/DFT.2019.8875328},
  doi          = {10.1109/DFT.2019.8875328},
  timestamp    = {Tue, 21 Mar 2023 20:57:35 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/KlineLMJ19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.