BibTeX record conf/dft/KarimiL01

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@inproceedings{DBLP:conf/dft/KarimiL01,
  author       = {Farzin Karimi and
                  Fabrizio Lombardi},
  title        = {Parallel Testing of Multi-port Static Random Access Memories for {BIST}},
  booktitle    = {16th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2001), 24-26 October 2001, San Francisco,
                  CA, USA, Proceedings},
  pages        = {271--279},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/DFTVS.2001.966779},
  doi          = {10.1109/DFTVS.2001.966779},
  timestamp    = {Fri, 24 Mar 2023 00:02:10 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/KarimiL01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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