BibTeX record conf/dft/JenihhinRBA19

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@inproceedings{DBLP:conf/dft/JenihhinRBA19,
  author       = {Maksim Jenihhin and
                  Matteo Sonza Reorda and
                  Aneesh Balakrishnan and
                  Dan Alexandrescu},
  title        = {Challenges of Reliability Assessment and Enhancement in Autonomous
                  Systems},
  booktitle    = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
                  October 2-4, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/DFT.2019.8875379},
  doi          = {10.1109/DFT.2019.8875379},
  timestamp    = {Sun, 02 Oct 2022 15:59:06 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/JenihhinRBA19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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