BibTeX record conf/dft/ChristouMT06

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@inproceedings{DBLP:conf/dft/ChristouMT06,
  author       = {Kyriakos Christou and
                  Maria K. Michael and
                  Spyros Tragoudas},
  title        = {Implicit Critical {PDF} Test Generation with Maximal Test Efficiency},
  booktitle    = {21th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia,
                  {USA}},
  pages        = {50--58},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/DFT.2006.34},
  doi          = {10.1109/DFT.2006.34},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ChristouMT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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