BibTeX record conf/dft/BackerHK14

download as .bib file

@inproceedings{DBLP:conf/dft/BackerHK14,
  author       = {Jerry Backer and
                  David H{\'{e}}ly and
                  Ramesh Karri},
  title        = {Reusing the {IEEE} 1500 design for test infrastructure for security
                  monitoring of Systems-on-Chip},
  booktitle    = {2014 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2014, Amsterdam, The Netherlands,
                  October 1-3, 2014},
  pages        = {52--56},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/DFT.2014.6962098},
  doi          = {10.1109/DFT.2014.6962098},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BackerHK14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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