BibTeX record conf/delta/YotsuyanagiHIIT02

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@inproceedings{DBLP:conf/delta/YotsuyanagiHIIT02,
  author       = {Hiroyuki Yotsuyanagi and
                  Masaki Hashizume and
                  Taisuke Iwakiri and
                  Masahiro Ichimiya and
                  Takeomi Tamesada},
  title        = {Random Pattern Testability of the Open Defect Detection Method using
                  Application of Time-variable Electric Field},
  booktitle    = {1st {IEEE} International Workshop on Electronic Design, Test and Applications
                  {(DELTA} 2002), 29-31 January 2002, Christchurch, New Zealand},
  pages        = {387--391},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/DELTA.2002.994656},
  doi          = {10.1109/DELTA.2002.994656},
  timestamp    = {Fri, 24 Mar 2023 00:04:37 +0100},
  biburl       = {https://dblp.org/rec/conf/delta/YotsuyanagiHIIT02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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