BibTeX record conf/ddecs/YamazakiWHY13

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@inproceedings{DBLP:conf/ddecs/YamazakiWHY13,
  author       = {Hiroshi Yamazaki and
                  Motohiro Wakazono and
                  Toshinori Hosokawa and
                  Masayoshi Yoshimura},
  editor       = {Luk{\'{a}}s Sekanina and
                  G{\"{o}}rschwin Fey and
                  Jaan Raik and
                  Snorre Aunet and
                  Richard Ruzicka},
  title        = {A don't care identification method for test compaction},
  booktitle    = {16th {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2013, Karlovy Vary, Czech Republic,
                  April 8-10, 2013},
  pages        = {215--218},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/DDECS.2013.6549819},
  doi          = {10.1109/DDECS.2013.6549819},
  timestamp    = {Fri, 24 Mar 2023 00:04:14 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/YamazakiWHY13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}