BibTeX record conf/ddecs/SamrowCGTT12

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@inproceedings{DBLP:conf/ddecs/SamrowCGTT12,
  author       = {Hagen S{\"{a}}mrow and
                  Claas Cornelius and
                  Philipp Gorski and
                  Andreas Tockhorn and
                  Dirk Timmermann},
  editor       = {Jaan Raik and
                  Viera Stopjakov{\'{a}} and
                  Heinrich Theodor Vierhaus and
                  Witold A. Pleskacz and
                  Raimund Ubar and
                  Helena Kruus and
                  Maksim Jenihhin},
  title        = {Selective redundancy to improve reliability and to slow down delay
                  degradation due to gate oxide breakdown},
  booktitle    = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
                  2012},
  pages        = {12--15},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/DDECS.2012.6219015},
  doi          = {10.1109/DDECS.2012.6219015},
  timestamp    = {Fri, 24 Mar 2023 00:04:14 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/SamrowCGTT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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