BibTeX record conf/ddecs/EggersglussKGHD12

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@inproceedings{DBLP:conf/ddecs/EggersglussKGHD12,
  author    = {Stephan Eggersgl{\"{u}}{\ss} and
               Rene Krenz{-}Baath and
               Andreas Glowatz and
               Friedrich Hapke and
               Rolf Drechsler},
  editor    = {Jaan Raik and
               Viera Stopjakov{\'{a}} and
               Heinrich Theodor Vierhaus and
               Witold A. Pleskacz and
               Raimund Ubar and
               Helena Kruus and
               Maksim Jenihhin},
  title     = {A new SAT-based {ATPG} for generating highly compacted test sets},
  booktitle = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
               Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
               2012},
  pages     = {230--235},
  publisher = {{IEEE}},
  year      = {2012},
  url       = {https://doi.org/10.1109/DDECS.2012.6219063},
  doi       = {10.1109/DDECS.2012.6219063},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/conf/ddecs/EggersglussKGHD12.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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