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BibTeX record conf/ddecs/AlmeidaBCRRAPTU19
@inproceedings{DBLP:conf/ddecs/AlmeidaBCRRAPTU19, author = {F. Almeida and Paolo Bernardi and D. Calabrese and Marco Restifo and Matteo Sonza Reorda and Davide Appello and Giorgio Pollaccia and Vincenzo Tancorre and Roberto Ugioli and Gulio Zoppi}, title = {Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test}, booktitle = {22nd {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2019, Cluj-Napoca, Romania, April 24-26, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DDECS.2019.8724644}, doi = {10.1109/DDECS.2019.8724644}, timestamp = {Thu, 29 Feb 2024 09:17:05 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/AlmeidaBCRRAPTU19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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