BibTeX record conf/ddecs/AlmeidaBCRRAPTU19

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@inproceedings{DBLP:conf/ddecs/AlmeidaBCRRAPTU19,
  author       = {F. Almeida and
                  Paolo Bernardi and
                  D. Calabrese and
                  Marco Restifo and
                  Matteo Sonza Reorda and
                  Davide Appello and
                  Giorgio Pollaccia and
                  Vincenzo Tancorre and
                  Roberto Ugioli and
                  Gulio Zoppi},
  title        = {Effective Screening of Automotive SoCs by Combining Burn-In and System
                  Level Test},
  booktitle    = {22nd {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2019, Cluj-Napoca, Romania, April
                  24-26, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/DDECS.2019.8724644},
  doi          = {10.1109/DDECS.2019.8724644},
  timestamp    = {Thu, 29 Feb 2024 09:17:05 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/AlmeidaBCRRAPTU19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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