BibTeX record conf/date/YeA0LP19

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@inproceedings{DBLP:conf/date/YeA0LP19,
  author    = {Wei Ye and
               Mohamed Baker Alawieh and
               Meng Li and
               Yibo Lin and
               David Z. Pan},
  title     = {Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2019, Florence, Italy, March 25-29, 2019},
  pages     = {54--59},
  year      = {2019},
  crossref  = {DBLP:conf/date/2019},
  url       = {https://doi.org/10.23919/DATE.2019.8714960},
  doi       = {10.23919/DATE.2019.8714960},
  timestamp = {Sat, 19 Oct 2019 20:34:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/YeA0LP19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2019,
  editor    = {J{\"{u}}rgen Teich and
               Franco Fummi},
  title     = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2019, Florence, Italy, March 25-29, 2019},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8704855/proceeding},
  isbn      = {978-3-9819263-2-3},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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