BibTeX record conf/date/Ye0NKX20

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@inproceedings{DBLP:conf/date/Ye0NKX20,
  author       = {Min Ye and
                  Qiao Li and
                  Jianqiang Nie and
                  Tei{-}Wei Kuo and
                  Chun Jason Xue},
  title        = {Valid Window: {A} New Metric to Measure the Reliability of {NAND}
                  Flash Memory},
  booktitle    = {2020 Design, Automation {\&} Test in Europe Conference {\&}
                  Exhibition, {DATE} 2020, Grenoble, France, March 9-13, 2020},
  pages        = {109--114},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.23919/DATE48585.2020.9116337},
  doi          = {10.23919/DATE48585.2020.9116337},
  timestamp    = {Sun, 25 Oct 2020 23:15:41 +0100},
  biburl       = {https://dblp.org/rec/conf/date/Ye0NKX20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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