BibTeX record conf/date/MirCLK96

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@inproceedings{DBLP:conf/date/MirCLK96,
  author    = {Salvador Mir and
               Bernard Courtois and
               Marcelo Lubaszewski and
               Vladimir Kolarik},
  title     = {Automatic Test Generation for Maximal Diagnosis of Linear Analogue
               Circuits},
  booktitle = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
               France, March 11-14, 1996},
  pages     = {254--258},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://doi.org/10.1109/EDTC.1996.494157},
  doi       = {10.1109/EDTC.1996.494157},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/date/MirCLK96.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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