BibTeX record conf/date/Liu0ZWLLX19

• > Home > conf/date/Liu0ZWLLX19

@inproceedings{DBLP:conf/date/Liu0ZWLLX19,
  author       = {Weihua Liu and
                  Fei Wu and
                  Meng Zhang and
                  Yifei Wang and
                  Zhonghai Lu and
                  Xiangfeng Lu and
                  Changsheng Xie},
  editor       = {J{\"{u}}rgen Teich and
                  Franco Fummi},
  title        = {Characterizing the Reliability and Threshold Voltage Shifting of 3D
                  Charge Trap {NAND} Flash},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2019, Florence, Italy, March 25-29, 2019},
  pages        = {312--315},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.23919/DATE.2019.8714941},
  doi          = {10.23919/DATE.2019.8714941},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/Liu0ZWLLX19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}