BibTeX record conf/date/JutmanLLRJRKKE17

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@inproceedings{DBLP:conf/date/JutmanLLRJRKKE17,
  author    = {Artur Jutman and
               Christophe Lotz and
               Erik Larsson and
               Matteo Sonza Reorda and
               Maksim Jenihhin and
               Jaan Raik and
               Hans G. Kerkhoff and
               Rene Krenz{-}Baath and
               Piet Engelke},
  editor    = {David Atienza and
               Giorgio Di Natale},
  title     = {{BASTION:} Board and SoC test instrumentation for ageing and no failure
               found},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages     = {115--120},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.23919/DATE.2017.7926968},
  doi       = {10.23919/DATE.2017.7926968},
  timestamp = {Fri, 27 Mar 2020 09:01:53 +0100},
  biburl    = {https://dblp.org/rec/conf/date/JutmanLLRJRKKE17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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