BibTeX record conf/dac/BanY11

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@inproceedings{DBLP:conf/dac/BanY11,
  author       = {Yongchan Ban and
                  Jae{-}Seok Yang},
  editor       = {Leon Stok and
                  Nikil D. Dutt and
                  Soha Hassoun},
  title        = {Layout aware line-edge roughness modeling and poly optimization for
                  leakage minimization},
  booktitle    = {Proceedings of the 48th Design Automation Conference, {DAC} 2011,
                  San Diego, California, USA, June 5-10, 2011},
  pages        = {447--452},
  publisher    = {{ACM}},
  year         = {2011},
  url          = {https://doi.org/10.1145/2024724.2024828},
  doi          = {10.1145/2024724.2024828},
  timestamp    = {Tue, 06 Nov 2018 16:58:15 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/BanY11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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