BibTeX record conf/ccece/WangLL0HK16

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@inproceedings{DBLP:conf/ccece/WangLL0HK16,
  author    = {Haibin Wang and
               Rui Liu and
               X.{-}T. Li and
               Li Chen and
               David M. Hiemstra and
               Valeri Kirischian},
  title     = {Total ionizing dose test facilities for micro-electronic circuits},
  booktitle = {2016 {IEEE} Canadian Conference on Electrical and Computer Engineering,
               {CCECE} 2016, Vancouver, BC, Canada, May 15-18, 2016},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/CCECE.2016.7726602},
  doi       = {10.1109/CCECE.2016.7726602},
  timestamp = {Wed, 20 Nov 2019 09:02:54 +0100},
  biburl    = {https://dblp.org/rec/conf/ccece/WangLL0HK16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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