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BibTeX record conf/ats/Pagey95
@inproceedings{DBLP:conf/ats/Pagey95, author = {Sandeep Pagey}, title = {Fast functional testing of delay-insensitive circuits}, booktitle = {4th Asian Test Symposium {(ATS} '95), November 23-24, 1995. Bangalore, India}, pages = {375--381}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/ATS.1995.485363}, doi = {10.1109/ATS.1995.485363}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/Pagey95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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