BibTeX record conf/ats/OshimaKWSK18

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@inproceedings{DBLP:conf/ats/OshimaKWSK18,
  author       = {Shigeyuki Oshima and
                  Takaaki Kato and
                  Senling Wang and
                  Yasuo Sato and
                  Seiji Kajihara},
  title        = {On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation
                  in Logic {BIST}},
  booktitle    = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
                  15-18, 2018},
  pages        = {30--35},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ATS.2018.00017},
  doi          = {10.1109/ATS.2018.00017},
  timestamp    = {Fri, 24 Mar 2023 00:02:33 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/OshimaKWSK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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