BibTeX record conf/ats/NakaoKHSN01

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@inproceedings{DBLP:conf/ats/NakaoKHSN01,
  author       = {Michinobu Nakao and
                  Yoshikazu Kiyoshige and
                  Kazumi Hatayama and
                  Yasuo Sato and
                  Takaharu Nagumo},
  title        = {Test Generation for Multiple-Threshold Gate-Delay Fault Model},
  booktitle    = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
                  Japan},
  pages        = {244},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/ATS.2001.990290},
  doi          = {10.1109/ATS.2001.990290},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/NakaoKHSN01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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