BibTeX record conf/ats/HsuDWLHW08

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@inproceedings{DBLP:conf/ats/HsuDWLHW08,
  author       = {Chun{-}Kai Hsu and
                  Li{-}Ming Denq and
                  Mao{-}Yin Wang and
                  Jing{-}Jia Liou and
                  Chih{-}Tsun Huang and
                  Cheng{-}Wen Wu},
  title        = {Area and Test Cost Reduction for On-Chip Wireless Test Channels with
                  System-Level Design Techniques},
  booktitle    = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
                  24-27, 2008},
  pages        = {245--250},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/ATS.2008.19},
  doi          = {10.1109/ATS.2008.19},
  timestamp    = {Sat, 30 Sep 2023 09:34:55 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/HsuDWLHW08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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