BibTeX record conf/ats/GoelCYPT10

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@inproceedings{DBLP:conf/ats/GoelCYPT10,
  author       = {Sandeep Kumar Goel and
                  Krishnendu Chakrabarty and
                  Mahmut Yilmaz and
                  Ke Peng and
                  Mohammad Tehranipoor},
  title        = {Circuit Topology-Based Test Pattern Generation for Small-Delay Defects},
  booktitle    = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
                  December 2010, Shanghai, China},
  pages        = {307--312},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/ATS.2010.59},
  doi          = {10.1109/ATS.2010.59},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/GoelCYPT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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