BibTeX record conf/ats/Al-ArsHV05

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@inproceedings{DBLP:conf/ats/Al-ArsHV05,
  author       = {Zaid Al{-}Ars and
                  Said Hamdioui and
                  J{\"{o}}rg E. Vollrath},
  title        = {Investigations of Faulty {DRAM} Behavior Using Electrical Simulation
                  Versus an Analytical Approach},
  booktitle    = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
                  India},
  pages        = {434--439},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ATS.2005.71},
  doi          = {10.1109/ATS.2005.71},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/Al-ArsHV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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