BibTeX record conf/apccas/UemoriYITKTNI10

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@inproceedings{DBLP:conf/apccas/UemoriYITKTNI10,
  author    = {Satoshi Uemori and
               Takahiro J. Yamaguchi and
               Satoshi Ito and
               Yohei Tan and
               Haruo Kobayashi and
               Nobukazu Takai and
               Kiichi Niitsu and
               Nobuyoshi Ishikawa},
  title     = {{ADC} linearity test signal generation algorithm},
  booktitle = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2010,
               Kuala Lumpur, Malaysia, December 6-9, 2010},
  pages     = {44--47},
  year      = {2010},
  crossref  = {DBLP:conf/apccas/2010},
  url       = {https://doi.org/10.1109/APCCAS.2010.5774755},
  doi       = {10.1109/APCCAS.2010.5774755},
  timestamp = {Wed, 17 May 2017 14:25:08 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/apccas/UemoriYITKTNI10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/apccas/2010,
  title     = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2010,
               Kuala Lumpur, Malaysia, December 6-9, 2010},
  publisher = {{IEEE}},
  year      = {2010},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5767825},
  isbn      = {978-1-4244-7454-7},
  timestamp = {Thu, 06 Mar 2014 08:39:29 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/apccas/2010},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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