BibTeX record conf/apccas/Marinissen10

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@inproceedings{DBLP:conf/apccas/Marinissen10,
  author       = {Erik Jan Marinissen},
  title        = {Challenges in testing TSV-based 3D stacked ICs: Test flows, test contents,
                  and test access},
  booktitle    = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2010,
                  Kuala Lumpur, Malaysia, December 6-9, 2010},
  pages        = {544--547},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/APCCAS.2010.5775087},
  doi          = {10.1109/APCCAS.2010.5775087},
  timestamp    = {Mon, 05 Feb 2024 20:31:26 +0100},
  biburl       = {https://dblp.org/rec/conf/apccas/Marinissen10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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