BibTeX record conf/aimech/LaiHTC18

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@inproceedings{DBLP:conf/aimech/LaiHTC18,
  author       = {Yu{-}Ting K. Lai and
                  Jwu{-}Sheng Hu and
                  Ya{-}Hui Tsai and
                  Wei{-}Yao Chiu},
  title        = {Industrial Anomaly Detection and One-class Classification using Generative
                  Adversarial Networks},
  booktitle    = {2018 {IEEE/ASME} International Conference on Advanced Intelligent
                  Mechatronics, {AIM} 2018, Auckland, New Zealand, July 9-12, 2018},
  pages        = {1444--1449},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/AIM.2018.8452228},
  doi          = {10.1109/AIM.2018.8452228},
  timestamp    = {Fri, 04 Dec 2020 08:54:17 +0100},
  biburl       = {https://dblp.org/rec/conf/aimech/LaiHTC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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