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Ron G. Walther

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Conference and Workshop Papers

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1997
[c4]
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  - conf/vts/AbadirAHHNW97
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  - https://dblp.org/rec/conf/vts/AbadirAHHNW97
Magdy S. Abadir, Jacob A. Abraham, Hong Hao, C. Hunter, Wayne M. Needham, Ron G. Walther:
Microprocessor Test and Validation: Any New Avenues? VTS 1997: 458-464
1994
[c3]
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  - conf/dac/AbrahamKPdDLSW94
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Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther:
Microprocessor Testing: Which Technique is Best? (Panel). DAC 1994: 294
1984
[c2]
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  dblp key:
  - conf/dac/DasguptaGRWW84
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Subrata Dasgupta, M. C. Graf, Robert A. Rasmussen, Ron G. Walther, Tom W. Williams:
Chip partitioning aid: A design technique for partitionability and testability in VLSI. DAC 1984: 203-208
1982
[c1]
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Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams:
A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. ITC 1982: 63-66

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