BibTeX records: Li Zhang 0033

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@article{DBLP:journals/mr/ZhangKOIMOSYHH15,
  author    = {Li Zhang and
               Mitsuo Koike and
               Mizuki Ono and
               Shogo Itai and
               Kazuya Matsuzawa and
               Syotaro Ono and
               Wataru Saito and
               Masakazu Yamaguchi and
               Yohei Hayase and
               Keiryo Hara},
  title     = {Comprehensive 2D-carrier profiling of low-doping region by high-sensitivity
               scanning spreading resistance microscopy {(SSRM)} for power device
               applications},
  journal   = {Microelectron. Reliab.},
  volume    = {55},
  number    = {9-10},
  pages     = {1559--1563},
  year      = {2015},
  url       = {https://doi.org/10.1016/j.microrel.2015.06.142},
  doi       = {10.1016/j.microrel.2015.06.142},
  timestamp = {Thu, 12 Nov 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/ZhangKOIMOSYHH15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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