BibTeX records: Wai-On Law

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@inproceedings{DBLP:conf/iccd/KangLU94,
  author    = {Sungho Kang and
               Wai{-}On Law and
               Bill Underwood},
  title     = {Path-Delay Fault Simulation for a Standard Scan Design Methodology},
  booktitle = {Proceedings 1994 {IEEE} International Conference on Computer Design:
               {VLSI} in Computer {\&} Processors, {ICCD} '94, Cambridge, MA,
               USA, October 10-12, 1994},
  pages     = {359--362},
  publisher = {{IEEE} Computer Society},
  year      = {1994},
  url       = {https://doi.org/10.1109/ICCD.1994.331926},
  doi       = {10.1109/ICCD.1994.331926},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/iccd/KangLU94.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/UnderwoodLKK94,
  author    = {Bill Underwood and
               Wai{-}On Law and
               Sungho Kang and
               Haluk Konuk},
  title     = {Fastpath: {A} Path-Delay Test Generator for Standard Scan Designs},
  booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
               Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages     = {154--163},
  publisher = {{IEEE} Computer Society},
  year      = {1994},
  url       = {https://doi.org/10.1109/TEST.1994.527946},
  doi       = {10.1109/TEST.1994.527946},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/UnderwoodLKK94.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AstrachanBELMNW92,
  author    = {Paul Astrachan and
               Todd Brooks and
               Jody Everett and
               Wai{-}On Law and
               Kenneth McIntyre and
               Chuong Nguyen and
               Charles Weng},
  title     = {Testing a DSP-Based Mixed-Signal Telecommunications Chip},
  booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
               New World of Test and Design, Baltimore, Maryland, USA, September
               20-24, 1992},
  pages     = {669--677},
  publisher = {{IEEE} Computer Society},
  year      = {1992},
  url       = {https://doi.org/10.1109/TEST.1992.527888},
  doi       = {10.1109/TEST.1992.527888},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/AstrachanBELMNW92.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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