BibTeX records: Wei Li 0023

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@inproceedings{DBLP:conf/isvlsi/LiRP05,
  author    = {Wei Li and
               Sudhakar M. Reddy and
               Irith Pomeranz},
  title     = {On Reducing Peak Current and Power during Test},
  booktitle = {2005 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI}
               2005), New Frontiers in {VLSI} Design, 11-12 May 2005, Tampa, FL,
               {USA}},
  pages     = {156--161},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://doi.org/10.1109/ISVLSI.2005.53},
  doi       = {10.1109/ISVLSI.2005.53},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/isvlsi/LiRP05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/LiWCR05,
  author    = {Wei Li and
               Seongmoon Wang and
               Srimat T. Chakradhar and
               Sudhakar M. Reddy},
  title     = {Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage},
  booktitle = {18th International Conference on {VLSI} Design {(VLSI} Design 2005),
               with the 4th International Conference on Embedded Systems Design,
               3-7 January 2005, Kolkata, India},
  pages     = {471--478},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://doi.org/10.1109/ICVD.2005.83},
  doi       = {10.1109/ICVD.2005.83},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/vlsid/LiWCR05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/LiRP04,
  author    = {Wei Li and
               Sudhakar M. Reddy and
               Irith Pomeranz},
  editor    = {Sharad Malik and
               Limor Fix and
               Andrew B. Kahng},
  title     = {On test generation for transition faults with minimized peak power
               dissipation},
  booktitle = {Proceedings of the 41th Design Automation Conference, {DAC} 2004,
               San Diego, CA, USA, June 7-11, 2004},
  pages     = {504--509},
  publisher = {{ACM}},
  year      = {2004},
  url       = {https://doi.org/10.1145/996566.996706},
  doi       = {10.1145/996566.996706},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/dac/LiRP04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/LiYRP03,
  author    = {Wei Li and
               Chaowen Yu and
               Sudhakar M. Reddy and
               Irith Pomeranz},
  title     = {A scan {BIST} generation method using a markov source and partial
               bit-fixing},
  booktitle = {Proceedings of the 40th Design Automation Conference, {DAC} 2003,
               Anaheim, CA, USA, June 2-6, 2003},
  pages     = {554--559},
  publisher = {{ACM}},
  year      = {2003},
  url       = {https://doi.org/10.1145/775832.775974},
  doi       = {10.1145/775832.775974},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/dac/LiYRP03.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/YuLRP03,
  author    = {Chaowen Yu and
               Wei Li and
               Sudhakar M. Reddy and
               Irith Pomeranz},
  title     = {An Improved Markov Source Design for Scan {BIST}},
  booktitle = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
               7-9 July 2003, Kos Island, Greece},
  pages     = {106--110},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://doi.org/10.1109/OLT.2003.1214375},
  doi       = {10.1109/OLT.2003.1214375},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/iolts/YuLRP03.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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