![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
Yungseon Eo
Person information
Refine list
![note](https://dblp1.uni-trier.de/img/note-mark.dark.12x12.png)
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2013
- [c10]Junghyun Lee, Yungseon Eo:
An efficient eye-diagram determination technique for multi-coupled interconnect lines. PATMOS 2013: 185-190 - 2012
- [j8]Dongchul Kim, Hyewon Kim, Yungseon Eo:
Analytical Eye-Diagram Determination for the Efficient and Accurate Signal Integrity Verification of Single Interconnect Lines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(10): 1536-1545 (2012) - 2010
- [j7]Hyunsik Kim, Yungseon Eo:
Compact CAD Models for the Signal Integrity Verification of Multi-Coupled Transmission Lines. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(4): 752-760 (2010) - [c9]Dongchul Kim, Hyewon Kim, Yungseon Eo:
Signal integrity verification of coupled interconnect lines using efficient eye-diagram determination. ISCAS 2010: 3669-3672
2000 – 2009
- 2008
- [j6]Taehoon Kim, Yungseon Eo:
Analytical CAD Models for the Signal Transients and Crosstalk Noise of Inductance-Effect-Prominent Multicoupled RLC Interconnect Lines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1214-1227 (2008) - [c8]Taehoon Kim, Dongchul Kim, Jung-A Lee, Yungseon Eo:
Compact Models for Signal Transient and Crosstalk Noise of Coupled RLC Interconnect Lines with Ramp Inputs. DELTA 2008: 205-209 - [c7]Dongchul Kim, Taehoon Kim, Jung-A Lee, Yungseon Eo:
Experimental Characterisations of Coupled Transmission Lines. DELTA 2008: 262-265 - 2007
- [c6]Taeyong Je, Yungseon Eo:
Efficient Signal Integrity Verification of Multi-Coupled Transmission Lines with Asynchronously Switching Non-Linear Drivers. ISQED 2007: 245-250 - [c5]Hyunsik Kim, Yungseon Eo:
High-Frequency-Measurement-Based Frequency-Variant Transmission Line Characterization and Circuit Modeling for Accurate Signal Integrity Verification. ISQED 2007: 507-512 - 2006
- [c4]Seongkyun Shin, Yungseon Eo:
Non-Physical Pseudo-Wave-Based Modal Decoupling Technique of Multi- Coupled Co-Planar Transmission Lines with Homogeneous Dielectric Media. ISQED 2006: 278-283 - [c3]Taeyong Je, Yungseon Eo:
Efficient Signal Integrity Verification Method of Multi-Coupled RLC Interconnect Lines with Asynchronous Circuit Switching. ISQED 2006: 419-424 - 2004
- [j5]Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim:
A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(9): 1321-1337 (2004) - [j4]Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. IEEE Trans. Very Large Scale Integr. Syst. 12(4): 395-407 (2004) - [c2]Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching. ISQED 2004: 337-342 - 2002
- [j3]Yungseon Eo, Jongin Shim, William R. Eisenstadt:
A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(6): 723-730 (2002) - [j2]Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim:
Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(12): 1489-1497 (2002) - [c1]Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects. SLIP 2002: 61-68 - 2001
- [j1]Woojin Jin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects. IEEE Trans. Very Large Scale Integr. Syst. 9(3): 450-460 (2001)
Coauthor Index
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 22:56 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint