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Subarna Sinha
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2010 – 2019
- 2017
- [j6]Fan Yang, Subarna Sinha, Charles C. Chiang, Xuan Zeng, Dian Zhou:
Improved Tangent Space-Based Distance Metric for Lithographic Hotspot Classification. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(9): 1545-1556 (2017) - 2016
- [c17]Subarna Sinha, David L. Dill:
Deciphering cancer biology using boolean methods. HLDVT 2016: 150-154 - 2014
- [j5]Wei Zhao, Hailong Yao, Yici Cai, Subarna Sinha, Charles C. Chiang:
Fast and scalable parallel layout decomposition in double patterning lithography. Integr. 47(2): 175-183 (2014) - [c16]Suman Deb, Subarna Sinha:
Comparative Improvement of Image Segmentation Performance with Graph Based Method over Watershed Transform Image Segmentation. ICDCIT 2014: 322-332 - 2013
- [c15]Subarna Sinha, Suman Deb:
Graph Coloring Problem Solution Using Modified Flocking Algorithm. SocProS (2) 2013: 113-123 - 2012
- [j4]Kai-Ti Hsu, Subarna Sinha, Yu-Chuan Pi, Tsung-Yi Ho:
A Hierarchy-Based Distributed Algorithm for Layout Geometry Operations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(10): 1546-1557 (2012) - [c14]Yen-Ting Yu, Ya-Chung Chan, Subarna Sinha, Iris Hui-Ru Jiang, Charles C. Chiang:
Accurate process-hotspot detection using critical design rule extraction. DAC 2012: 1167-1172 - [c13]Jing Guo, Fan Yang, Subarna Sinha, Charles C. Chiang, Xuan Zeng:
Improved tangent space based distance metric for accurate lithographic hotspot classification. DAC 2012: 1173-1178 - 2011
- [j3]Yu-Shen Yang, Subarna Sinha, Andreas G. Veneris, Robert K. Brayton:
Automating Logic Transformations With Approximate SPFDs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(5): 651-664 (2011) - [c12]Kai-Ti Hsu, Subarna Sinha, Yu-Chuan Pi, Charles C. Chiang, Tsung-Yi Ho:
A distributed algorithm for layout geometry operations. DAC 2011: 182-187 - 2010
- [c11]Linfu Xiao, Subarna Sinha, Jingyu Xu, Evangeline F. Y. Young:
Fixed-outline thermal-aware 3D floorplanning. ASP-DAC 2010: 561-567
2000 – 2009
- 2009
- [c10]Charles C. Chiang, Subarna Sinha:
The road to 3D EDA tool readiness. ASP-DAC 2009: 429-436 - [c9]Yu-Shen Yang, Subarna Sinha, Andreas G. Veneris, Robert K. Brayton, Duncan Exon Smith:
Sequential logic rectifications with approximate SPFDs. DATE 2009: 1698-1703 - 2008
- [j2]Hailong Yao, Subarna Sinha, Jingyu Xu, Charles C. Chiang, Yici Cai, Xianlong Hong:
Efficient range pattern matching algorithm for process-hotspot detection. IET Circuits Devices Syst. 2(1): 2-15 (2008) - 2007
- [j1]Charles C. Chiang, Andrew B. Kahng, Subarna Sinha, Xu Xu, Alexander Zelikovsky:
Fast and Efficient Bright-Field AAPSM Conflict Detection and Correction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(1): 115-126 (2007) - [c8]Subarna Sinha, Jianfeng Luo, Charles C. Chiang:
Model Based Layout Pattern Dependent Metal Filling Algorithm for Improved Chip Surface Uniformity in the Copper Process. ASP-DAC 2007: 1-6 - [c7]Subarna Sinha, Charles C. Chiang:
A methodology for fast and accurate yield factor estimation during global routing. ICCAD 2007: 481-487 - [c6]Jingyu Xu, Subarna Sinha, Charles C. Chiang:
Accurate detection for process-hotspots with vias and incomplete specification. ICCAD 2007: 839-846 - [c5]Subarna Sinha, Qing Su, Linni Wen, Frank Lee, Charles C. Chiang, Yi-Kan Cheng, Jin-Lien Lin, Yu-Chyi Harn:
A New Flexible Algorithm for Random Yield Improvement. ISQED 2007: 795-800 - [i1]Charles C. Chiang, Andrew B. Kahng, Subarna Sinha, Xu Xu, Alexander Zelikovsky:
Bright-Field AAPSM Conflict Detection and Correction. CoRR abs/0710.4661 (2007) - 2006
- [c4]Jianfeng Luo, Subarna Sinha, Qing Su, Jamil Kawa, Charles C. Chiang:
An IC manufacturing yield model considering intra-die variations. DAC 2006: 749-754 - [c3]Hailong Yao, Subarna Sinha, Charles C. Chiang, Xianlong Hong, Yici Cai:
Efficient process-hotspot detection using range pattern matching. ICCAD 2006: 625-632 - 2005
- [c2]Charles C. Chiang, Andrew B. Kahng, Subarna Sinha, Xu Xu, Alexander Zelikovsky:
Bright-Field AAPSM Conflict Detection and Correction. DATE 2005: 908-913 - [c1]Charles C. Chiang, Andrew B. Kahng, Subarna Sinha, Xu Xu:
Fast and efficient phase conflict detection and correction in standard-cell layouts. ICCAD 2005: 149-156
Coauthor Index
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