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Shin-Ichiro Kuroki

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2010 – 2019

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2010
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Takashi Ito, Xiaoli Zhu, Shin-Ichiro Kuroki, Koji Kotani:
Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels. IEICE Trans. Electron. 93-C(11): 1638-1644 (2010)

2000 – 2009

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2007
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Xiaoli Zhu, Shin-Ichiro Kuroki, Koji Kotani, Hideharu Shido, Masatoshi Fukuda, Yasuyoshi Mishima, Takashi Ito:
Characteristics of Nano-Grating N-Channel MOSFETs for Improved Current Drivability. IEICE Trans. Electron. 90-C(9): 1830-1836 (2007)

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