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Mohammed R. Madani

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1990 – 1999

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1998
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M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi:
Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(4): 366-371 (1998)
1994
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M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi:
Parameterized Modeling of Open-Circuit Critical Volume for Three-Dimensional Defects in VLSI Processing. VLSI Design 1994: 333-338

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