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M. Vakiv

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2001
[j1]
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O. Mrooz, A. Kovalski, J. Pogorzelska, O. I. Shpotyuk, M. Vakiv, Bohdan S. Butkiewicz, J. Maciak:
Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits. Microelectron. Reliab. 41(5): 773-777 (2001)

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