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Toshifumi Kobayashi

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2000 – 2009

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2007
[j3]
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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Trans. Inf. Syst. 90-D(3): 685-687 (2007)
2004
[j2]
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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Trans. Inf. Syst. 87-D(3): 551-556 (2004)
2003
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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium 2003: 406-411
2002
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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium 2002: 417-422

1990 – 1999

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1996
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Yoichiro Sato, Takuji Okamoto, Yuji Sugiyama, Masahiro Kawai, Toshifumi Kobayashi:
A method of shortening metastable operation duration time by the use of feedback. Syst. Comput. Jpn. 27(10): 23-32 (1996)

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