LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs.

Wed, 01 Jan 2025 00:00:00 +0100

Mohammed Zine E. Brahmi, Jennifer Dworak, Martina Perkovic, Megan Appel, Saidapet Ramesh, Ravi J. N, Ramanath Dharmavarm, Arun Kumar Anjaneyareddy, Chen He:
LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs. ITC 2025: 141-150