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Hasin Ishraq Reefat

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2023
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Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Aging-Induced Failure Prognosis via Digital Sensors. ACM Great Lakes Symposium on VLSI 2023: 703-708

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