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Lowry P.-T. Wang

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Conference and Workshop Papers

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2024
[c3]
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Ralf E.-H. Yee, Nicholas Y.-J. Su, Lowry P.-T. Wang, Charles H.-P. Wen, Herming Chiueh:
Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Design For Automotive Electronics. VTS 2024: 1-7
2023
[c2]
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Sam M.-H. Hsiao, Amy H.-Y. Tsai, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen, Herming Chiueh:
Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs. ITC 2023: 276-285
2022
[c1]
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Sam M.-H. Hsiao, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen:
Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies. ITC 2022: 128-136

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